EAST GRINSTEAD, England—Thermo Fisher Scientific recently released its Nexsa surface analysis system, which it claims provides cost-effective support to research-level X-ray photoelectron spectroscopy studies. The system is suitable for use in academic and corporate laboratories, according to the company.
Thermo Fisher also noted that the Nexsa system combines the high throughput and high sensitivity of the Thermo Scientific K-Alpha+ XPS system with the multi-technique capabilities of the Thermo Scientific ESCALAB Xi+ XPS microprobe. It also allow users the option to add complementary techniques, such as Raman spectroscopy, ion scattering spectroscopy, reflected electron energy loss spectroscopy and UV photoelectron spectroscopy, which will help to generate multiple measurements from the same point on the sample, without repositioning.
Integration of multiple analytical techniques is designed to allow users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanomaterials development and many other fields, the firm said.
"We designed the Nexsa system with shared-use laboratories in mind, following the success of the K-Alpha+ in these facilities around the world," Kevin Fairfax, business director, surface analysis for Thermo Fisher, said in a news release. "The new system makes world-class surface analysis more accessible to non-experts, who can now combine multiple techniques and confidently produce world-class data with minimal training and effort."
Additional features of the Nexsa surface analysis system include:
- A new small spot X-ray source, designed to improve the imaging capabilities compared to previous instruments;
- The ability to transfer air-sensitive materials, such as lithium-ion battery materials, into the instrument without exposure to the atmosphere either via an optional vacuum transfer module or integration with an external glove box; and
- Optional integration with the patented Thermo Scientific MAGCIS dual mode ion source to enable depth profiling of soft materials, such as polymers.