Tire analysis using modulus profile technique

The modulus (indentation modulus) profiler was developed in 1987 by Gillen, Clough, and Quintana (Polymer Degradation and Stability 17, 1987, 31-47). The technique has a spacial resolution of about 100 microns. Recently,2 a finer tip has been developed enabling significantly improved resolution, to approximately 25 microns (four times better resolution). This resolution enables new studies, including compound interfaces and properties close to steel cords and fabric cords.