(Oct. 3, 2011)—Keyance Corp. has released its VK-X Series of 3D laser scanning microscopes. The line combines the capabilities of SEMs and noncontact roughness gauges with the simplicity of an optical microscope, the company said.
This system includes 0.5 nanometer Z-axis resolution with a magnification range spanning 200x–24,000x, Keyance said. A short-wavelength laser scans across a target to provide noncontact profile, roughness and thickness measurements, even on targets with highly-angular surfaces, according to the company.
For more information, visit www.digitalmicroscope.com/PRVKX.