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New Products: Starrett digital force testers

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ATHOL, Mass.—L.S. Starrett Co. has developed a series of motorized digital test frames designed to perform a variety of basic, high volume in-situ lean manufacturing force testing applications.

The firm said its FMM Digital Force Testers are part of the its new Starrett L1 line of entry level computer-based force measurement solutions, which include applications such as tension, compression, flexural cyclic, shear and friction.

FFM Digital Force Testers are optimized for production and quality control testing, Starrett said, adding that the L1 system is designed for fast, easy-to-use, reliable and repeatable operation. The testers can be used with either Starrett's L1 software for computer-controlled testing, or with a Starrett DFC Digital Force Gage, allowing users to control the speed and travel of the FFM series.

Starrett noted that its FFM series test frames have small footprints at 11 inches wide and 16 inches deep, and feature an adjustable, cast aluminum plate. They are available in three force capacities: 110lbf, 330lbf and 550lbf (500N, 1500N and 2500N), with a standard travel length of 20 inches (508mm) or an extended travel length of 30 inches (760mm).

The test frames have a speed range of .02 inches to 40 inches per minute (1mm to 1000mm per minute), according to Starrett.

Manufactured in the U.S., Starrett test frames are CE compliant and offer USB and RS-232 communication. They have configurable I/O for use with annunciators and other external devices.

Additional information about these and other Starrett force testers is available at starrett.com.

The New Products blog showcases innovations suppliers are introducing to the rubber industry. It focuses on new materials, machinery, molds, testing equipment, software, and other goods and services that are intended to help manufacturers of finished rubber products. The blog will appear on Tuesdays and Thursdays. To have your product considered for the blog, contact Online Content Editor Erin Pustay Beaven at ebeaven@crain.com or Editor Bruce Meyer at bmeyer@crain.com.