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Tire analysis using modulus profile technique

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The modulus (indentation modulus) profiler was developed in 1987 by Gillen, Clough, and Quintana (Polymer Degradation and Stability 17, 1987, 31-47). The technique has a spacial resolution of about 100 microns. Recently,2 a finer tip has been developed enabling significantly improved resolution, to approximately 25 microns (four times better resolution). This resolution enables new studies,